Sn-Ag-Cu lead free solder SMT process

被引:0
|
作者
Shieh, PY [1 ]
机构
[1] ITRI, Comp & Commun Lab, Hsinchu, Taiwan
关键词
SnAgCu; lead-free solder; reflow;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper several design of experiment are used to evaluate the SnAgCu alloy, the procedure of these experiment are done through normal surface mount process such as screen printing and reflow. In this study, component like BGA is used to simulate normal SMT process. The first investigation topic is screen printer parameter. The study of printing parameter includes which how to evaluate the printing results and compares the results with traditional printing process. The second topic is reflow profile. The reflow profile is a very import issues in lead free solder because of higher peak temperature that will impacts the components and PCB. In the study of reflow profile, an important part of the reflow is the inspect criteria of temperature profile. Some test methods like electrical test, cross-section, X-ray inspection, peeling test, were used to examine solder joint quality. The study compares the differences of SnAgCu solder with Sn/Pb solder (traditional reflow profile). Printed circuit board is an important part of the entire solder joint system. Two types of test board surface finish, Ni/Au surface finish and OSP surface finish, were studied for the effect on the solder joint quality. Furthermore, the study also compares the difference of atmosphere, air and nitrogen, in SnAgCu soldering process.
引用
收藏
页码:83 / 86
页数:4
相关论文
共 50 条
  • [41] Creep Behavior of Lead-Free Sn-Ag-Cu + Ni-Ge Solder Alloys
    N. Hidaka
    H. Watanabe
    M. Yoshiba
    Journal of Electronic Materials, 2009, 38 : 670 - 677
  • [42] Effect of cerium on wettability and mechanical properties of soldered joints for Sn-Ag-Cu lead free solder
    Xue, Song-Bai
    Chen, Yan
    Lu, Xiao-Chun
    Liao, Yong-Ping
    Hanjie Xuebao/Transactions of the China Welding Institution, 2005, 26 (10): : 1 - 4
  • [43] Influence of gallium addition in Sn-Ag-Cu lead-fee solder
    Chen, HuiMing
    Guo, ChengJun
    Huang, JiaPeng
    Wang, Hang
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2015, 26 (07) : 5459 - 5464
  • [44] Selection of Sn-Ag-Cu lead-free alloys
    Suganuma, K
    Kim, KS
    Huh, SH
    2001 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS, 2001, 4587 : 529 - 534
  • [45] Development of a lead-free composite solder from Sn-Ag-Cu and Ag-coated carbon nanotubes
    Chantaramanee, S.
    Wisutmethangoon, S.
    Sikong, L.
    Plookphol, T.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2013, 24 (10) : 3707 - 3715
  • [46] Growth of Sn and intermetallic compounds in Sn-Ag-Cu solder
    Lehman, LP
    Athavale, SN
    Fullem, TZ
    Giamis, AC
    Kinyanjui, RK
    Lowenstein, M
    Mather, K
    Patel, R
    Rae, D
    Wang, J
    Xing, Y
    Zavalij, L
    Borgesen, P
    Cotts, EJ
    JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (12) : 1429 - 1439
  • [47] Improvement of Joint Reliability of Sn-Ag-Cu Solder Bumps on Cu by a Laser Process
    Nishikawa, Hiroshi
    Iwata, Noriya
    MATERIALS TRANSACTIONS, 2015, 56 (07) : 1025 - 1029
  • [48] Effect of Mn on Sn-Ag-Cu ternary lead free solder alloy-Cu assembly: a comparative study
    Ghosh, M.
    Gunjan, M. K.
    Das, S. K.
    Kar, A.
    Ghosh, R. N.
    Ray, A. K.
    MATERIALS SCIENCE AND TECHNOLOGY, 2010, 26 (05) : 610 - 614
  • [49] Interfacial reaction and joint reliability of Sn-Ag-Cu/OSP-Cu pad SMT solder joint
    Wang, Lei
    Xie, Xiaoqiang
    Lee, Taekoo
    ICEPT: 2006 7TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2006, : 846 - +
  • [50] Growth of Sn and intermetallic compounds in Sn-Ag-Cu solder
    L. P. Lehman
    S. N. Athavale
    T. Z. Fullem
    A. C. Giamis
    R. K. Kinyanjui
    M. Lowenstein
    K. Mather
    R. Patel
    D. Rae
    J. Wang
    Y. Xing
    L. Zavalij
    P. Borgesen
    E. J. Cotts
    Journal of Electronic Materials, 2004, 33 : 1429 - 1439