Preparation and characterization of compositionally graded epitaxial barium strontium titanate thin films via scanning probe microscopy

被引:0
|
作者
Lu, SG [1 ]
Chen, H
Mak, CL
Wong, KH
Chan, HLW
Choy, CL
Xu, JJ
Shi, SQ
机构
[1] City Univ Hong Kong, Dept Phys & Mat Sci, Hong Kong, Hong Kong, Peoples R China
[2] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China
[3] Hong Kong Polytech Univ, Mat Res Ctr, Hong Kong, Hong Kong, Peoples R China
[4] Hong Kong Polytech Univ, Dept Mech Engn, Hong Kong, Hong Kong, Peoples R China
来源
关键词
barium strontium titanate; thin film; scanning force microscopy;
D O I
10.4028/www.scientific.net/KEM.280-283.1903
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3 (x = 0.75, 0.8, 0.9, 1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140degreesC. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperature dependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric-paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.
引用
收藏
页码:1903 / 1907
页数:5
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