Nucleation and evolution of zinc phthalocyanine thin films on the deactivated Si(111)-B √3 x √3 R30° surface

被引：11

作者：

Wagner, Sean R. ^{[1
]}

Zhang, Pengpeng ^{[1
]}

机构：

[1] Michigan State Univ, Dept Phys & Astron, E Lansing, MI 48824 USA

来源：

SURFACE SCIENCE | 2014年 / 630卷

关键词：

Scanning tunneling microscopy; Phthalocyanine; Moire pattern; Ehrlich-Schwoebel barrier; Grain boundary; Self-assembly; HYDROGEN-TERMINATED SI(111); STEP-EDGE BARRIERS; COPPER PHTHALOCYANINE; GROWTH; POLYCRYSTALLINE; ORIENTATION; MORPHOLOGY; ISLANDS; PTCDA;

D O I：

10.1016/j.susc.2014.06.025

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We report the growth evolution of thermally evaporated zinc phthalocyanine (ZnPc) on the deactivated Si(111) surface using scanning tunneling microscopy (STM). We find that the Ehrlich-Schwoebel barrier (ESB) associated with the ZnPc step edges is negligible, while the formation of molecular domain boundaries provides an activation barrier and additional nucleation sites which increases the film roughness and interrupts the anisotropic step-flow growth. By increasing the substrate temperature, the grain boundary density is significantly reduced, resulting in a well-controlled surface morphology. This study provides insight into the influence of the ESB and the grain boundary crossing barrier on the growth dynamics of organic thin films. (C) 2014 Elsevier B.V. All rights reserved.

引用

页码：22 / 27

页数：6

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