Effective Methods for Evaluation of High Power Laser Diode Quality and Reliability

被引：0
|
作者：
Lu, Guoguang [1 ]
Xie, Shaofeng [1 ]
Huang, Yun [1 ]
Cao, Junsheng [2 ]
机构：
[1] CEPREI, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou, Guangdong, Peoples R China
[2] Chinese Acad Sci, State Key Lab Luminescence & Applicat, Changchun Inst Opt Fine Mech & Phys, Changchun, Jilin, Peoples R China
来源：
PROCEEDINGS OF 2014 10TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS), VOLS I AND II | 2014年
关键词：
laser diode; reliability; electrical derivative; aging; SEMICONDUCTOR-LASERS;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this paper, a high power laser diode electrical derivative parameters test instrument is developed, the wavelength range of this instrument is between 400nm to 1300nm, the power range of this instrument is between 1W to 15W. The relationships between the device reliability and the electrical derivative parameters are discussed. Then the measurements of 20 high power 808nm AlGaAs/GaAs laser diodes by using this instrument combined with the aging test results demonstrate that the electrical derivative parameters can use to evaluate the laser diode reliability and quality effectively.
引用
收藏
页码：874 / 877
页数：4
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