Tradeoff between speed and static power dissipation of ultra-thin body SOI MOSFETs

被引:0
|
作者
Tian Yu [1 ]
Huang Ru [1 ]
Zhang Xing [1 ]
Wang Yang-Yuan [1 ]
机构
[1] Peking Univ, Inst Microelect, Beijing 100871, Peoples R China
来源
CHINESE PHYSICS | 2007年 / 16卷 / 06期
关键词
ultra-thin-body; SOI; MOSFET; simulation;
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The speed performance and static power dissipation of the ultra-thin-body (UTB) MOSFETs have been comprehensively investigated, with both DC and AC behaviours considered. Source/drain extension width (Lsp) and silicon film thickness (t(si)) are two independent parameters that influence the speed and static power dissipation of UTB siliconon-insulator (SOI) MOSFETs respectively, which can result in great design flexibility. Based on the different effects of physical and geometric parameters on device characteristics, a method to alleviate the contradiction between power dissipated and speed of UTB SOI MOSFETs is proposed. The optimal design regions of t(si) and L-sp for low operating power and high performance logic applications are given, which may shed light on the design of UTB SOI MOSFETs.
引用
收藏
页码:1743 / 1747
页数:5
相关论文
共 50 条
  • [21] Characterization of ultra-thin SOI MOSFETs by coupling effect between front and back interfaces
    Ohata, A
    Cristoloveanu, S
    Cassé, M
    Vandooren, A
    Daugé, F
    2005 IEEE INTERNATIONAL SOI CONFERENCE, PROCEEDINGS, 2005, : 63 - 64
  • [22] RF Behavior of Undoped Channel Ultra-Thin Body with Ultra-thin BOX MOSFETs
    Arshad, M. K. Md
    Emam, M.
    Kilchystka, V.
    Andrieu, F.
    Flandre, D.
    Raskin, J. -P.
    2012 IEEE 12TH TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS (SIRF), 2012, : 105 - 108
  • [23] Characterization of ultra-thin SOI films for double-gate MOSFETs
    Allibert, F
    Vinet, M
    Lolivier, J
    Deleonibus, S
    Cristoloveanu, S
    2002 IEEE INTERNATIONAL SOI CONFERENCE, PROCEEDINGS, 2002, : 187 - 188
  • [24] A specific floating-body effect in fully depleted SOI MOSFETs with ultra-thin gate oxide
    Cassé, M
    Prétet, J
    Cristoloveanu, S
    Poiroux, T
    Raynaud, C
    Reimbold, G
    MICROELECTRONIC ENGINEERING, 2004, 72 (1-4) : 352 - 356
  • [25] A COMPARATIVE STUDY ON ANALOG/RF PERFORMANCE OF ULTRA-THIN BODY (UTB) SOI AND DOUBLE GATE MOSFETs
    Soin, Norhayati
    Lun, Yan Ching
    ICSE: 2008 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS, 2008, : 76 - 81
  • [26] On the gm/ID-based approaches for threshold voltage extraction in advanced MOSFETs and their application to ultra-thin body SOI MOSFETs
    Rudenko, T.
    Arshad, M. K. Md
    Raskin, J-P
    Nazarov, A.
    Flandre, D.
    Kilchytska, V.
    SOLID-STATE ELECTRONICS, 2014, 97 : 52 - 58
  • [27] ANALYTICAL MODELING OF ULTRA-THIN FILM DEPLETION-MODE SOI MOSFETS
    BALESTRA, F
    BRINI, J
    GHIBAUDO, G
    SOLID-STATE ELECTRONICS, 1991, 34 (12) : 1361 - 1364
  • [28] HOT-CARRIER RELIABILITY IN SUBMICROMETER ULTRA-THIN SOI-MOSFETS
    YAMAGUCHI, Y
    SHIMIZU, M
    INOUE, Y
    NISHIMURA, T
    TSUKAMOTO, K
    IEICE TRANSACTIONS ON ELECTRONICS, 1992, E75C (12) : 1465 - 1470
  • [29] Self-aligned Π-shaped source/drain ultra-thin SOI MOSFETs
    Eng, Yi-Chuen
    Lin, Jyi-Tsong
    Lin, Po-Hsieh
    Huang, Hau-Yuan
    Kang, Shiang-Shi
    Kao, Kung-Kai
    Lin, Jeng-Da
    Tseng, Yi-Ming
    Tsai, Ying-Chieh
    2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, 2008, : 485 - 488
  • [30] Growth of epitaxial CoSi2 for contacts of ultra-thin SOI MOSFETs
    Sakamoto, K
    Maeda, T
    Hasegawa, M
    THIN SOLID FILMS, 2000, 369 (1-2) : 240 - 243