Study on the Key Technology of Integrated Analog Chip Test and System Design

被引：0
|
作者：
Liu Jingmeng [1 ]
Liao Min [1 ]
Chen Weihai [1 ]
Xu Dong [2 ]
机构：
[1] Beijing Univ Aeronaut & Astronaut, Sch Automat, Beijing 100191, Peoples R China
[2] Beijing Univ Aeronaut & Astronaut, Robot Inst, Beijing 100191, Peoples R China
来源：
ICIEA: 2009 4TH IEEE CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS, VOLS 1-6 | 2009年
关键词：
integrated analog chip; AD converter; LCD; self-recovery fuse; bus; SIGNAL;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
An integrated analog chip tester has been designed. Since we need to test the analog voltage of analog devices, a kernel architecture based on Single Chip Computer(MCU) and AD converter has been designed. In order to solve the possible blight to tester caused by the damaged chips. This paper presents a technology for isolating inside and outside bus, a technology for double power supplies and a technology for power supply protection. The whole design idea of the tester is introduced in detail. AD converter circuit, DA converter circuit, Op amp testing circuit, CW3524 testing circuit and LCD interface circuit have been designed. The procedure of software design is presented, and the primary software modules are explained in detail. Experiment showpiece has been developed. The results of experiments verify the correctness of the design.
引用
收藏
页码：484 / +
页数：3
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