Local electrical characteristics of passive films formed on stainless steel surfaces by current sensing atomic force microscopy

被引：39
|
作者：
Souier, T. [1 ]
Martin, F. [2 ]
Bataillon, C. [2 ]
Cousty, J. [1 ]
机构：
[1] CEA Saclay, Serv Phys & Chim Surfaces & Interfaces, F-91191 Gif Sur Yvette, France
[2] CEA Saclay, Lab Etud Corros Aqueuse, F-91191 Gif Sur Yvette, France
来源：
APPLIED SURFACE SCIENCE | 2010年 / 256卷 / 08期
关键词：
Stainless steel; Passive film; Conducting atomic force microscopy; Semiconductor; IN-SITU; ELECTRONIC-PROPERTIES; PITTING CORROSION; FE/CR ALLOYS; CR-OXIDE; INITIATION; BEHAVIOR; DISSOLUTION; INCLUSIONS; LAYERS;
D O I：
10.1016/j.apsusc.2009.10.083
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A current sensing atomic force microscope was used to study the topography and the local electronic properties of the passive film formed on a duplex ferrite-austenite stainless steel (Uranus 50). Comparison of current maps with topography AFM images reveals that the passive film covering austenite and ferrite phases exhibits different properties. On freshly formed passive film, a high and homogenous resistance (typically 10 G Omega for 1 V) characterises the film on austenite grains while current maps of the passive layer covering the ferrite grains show a high density of spots (few 100 M Omega for 1 V). Besides the current maps, local I-V curves acquired on austenite show wider band gap energy than the ones obtained on ferrite grains. Finally, the conductivity difference in passive films covering ferrite and austenite grains is discussed. (C) 2009 Elsevier B. V. All rights reserved.
引用
收藏
页码：2434 / 2439
页数：6
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