Effects of ball bond diameter on wire bond reliability for automotive application

被引:2
|
作者
Peng, Hui Yuen [1 ]
Devarajan, Mutharasu [1 ]
Lee, Teik Toon [2 ]
Lacey, David [3 ]
机构
[1] Univ Sains Malaysia, Sch Phys, Georgetown, Malaysia
[2] OSRAM Opto Semicond Sdn Bhd, Solid State Lighting Dept, Georgetown, Malaysia
[3] OSRAM Opto Semicond Sdn Bhd, R&D Dept, Georgetown, Malaysia
关键词
Semiconductor technology; Microelectronics packaging; Light emitting diode; Ball bond diameter; Gold wire diameter; Wire bond reliability; COMSOL Multiphysics simulation; MODEL;
D O I
10.1108/MI-02-2015-0020
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Purpose - The purpose of this paper is to investigate the reliability of wire bonds with three varying ball bond diameters, which are ball bonded with three different sizes of gold wires in light-emitting diode (LED) package under high-temperature environment. In automotive applications, "lifted ball bond" issue is a potential critical point for LED device reliability, as the wire bonds are usually stressed under high operating temperature during their lifetime. Moreover, the reliability of wire bonds in recent LED production has fallen under scrutiny due to the practice of reducing wire diameters to cut down production costs. Design/methodology/approach - Three gold wires with sizes of 2, 1.5 and 1 mm were ball bonded on the LED chip bond pad via thermosonic wire bonding method to produce three different ball bond diameters, that is, 140, 120 and 100 mu m, respectively. The reliability of these wire bond samples was then studied by performing isothermal aging at 200 degrees C for the time interval of 30, 100 and 500 hours. To validate hypotheses based on the experimental data, COMSOL Multiphysics simulation was also applied to study the thermal stress distribution of wire bond under an elevated temperature. Findings - Experimental results show that the interfacial adhesion of wire bond degrades significantly after aging at 200 degrees C for 500 hours, and the rate of interfacial degradation was found to be more rapid in the wire bond with smaller ball bond diameter. Experimental results also show that ball bonds randomly elongate along an axis and deforms into elliptical shapes after isothermal aging, and ball bonds with smaller diameters develop more obvious elongations. This observation has not been reported in any previous studies. Simulation results show that higher thermal stress is induced in the wire bond with the decrease of ball bond diameter. Practical implications - The reliability study of this paper provides measurements and explanation on the effects of wire diameter downsizing in wire bonds for automotive application. This is applicable as a reliability reference for industries who intend to reduce their production costs. Other than that, the analysis method of thermal stresses using COMSOL Multiphysics simulations can be extended by other COMSOL Multiphysics users in the future. Originality/value - To resolve "lifted ball bond" issue, optimization of the bond pad surface quality and the wire bond parameter has been studied and reported in many studies, but the influence of ball bond diameter on wire bond reliability is rarely focused. Moreover, the observation of ball bonds randomly elongate and deform more into elliptical shape, and ball bond with smaller diameter has the highest elongation after isothermal aging also still has not been reported in any previous studies.
引用
收藏
页码:53 / 60
页数:8
相关论文
共 50 条
  • [21] Development and Qualification of Copper Wire Bond Process for Automotive Applications
    Hiew, Pey Fang
    Au, Yin Kheng
    Eu, Poh Leng
    14TH INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING (EMAP 2012), 2012,
  • [22] Crevice Corrosion of Ball Bond Intermetallics of Cu and Ag Wire
    van Soestbergen, M.
    Mavinkurve, A.
    Zaal, J. J. M.
    O'Halloran, G. M.
    Rongen, R. T. H.
    Farrugia, M. L.
    2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2016, : 774 - 781
  • [23] Effect of Bond Geometry on Shear Strength and HTS Reliability for Au Ball Bond on Al Pad
    Gomes, J.
    Mayer, M.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2016, 6 (02): : 306 - 313
  • [24] Effect of wire diameter and hook location on second bond failure modes
    Harun, Fuaida
    Ismail, Roslina
    Jalar, Azman
    Abdullah, Shahrum
    MICROELECTRONICS INTERNATIONAL, 2015, 32 (01) : 32 - 36
  • [25] Assessment of 20 micron diameter wires for wire bond interconnect technology
    Kudtarkar, S. A.
    Murcko, R.
    Srihari, K.
    Saiyed, S.
    IPACK 2007: PROCEEDINGS OF THE ASME INTERPACK CONFERENCE 2007, VOL 1, 2007, : 923 - 930
  • [26] Coated Silver Wire Bond: Reliability of Epoxy Molded Device
    Murali, Sarangapani
    Senthilkumar, Balasubramanian
    Eric, Tan Swee Seng
    Jason, Wong Chin Yeung
    2018 IEEE 20TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2018, : 771 - 775
  • [27] Effects of probe damage on wire bond integrity
    Hotchkiss, G
    Ryan, G
    Subido, W
    Broz, J
    Mitchell, S
    Rincon, R
    Rolda, R
    Guimbaolibot, L
    51ST ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2001, : 1175 - 1180
  • [28] To study the high temperature effects on ball bonds using low K material in wire bond devices
    Kudtarkar, S. A.
    Murcko, R.
    Srihari, K.
    Saiyed, S.
    PROCEEDINGS OF THE ASME INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION 2007, VOL 5: ELECTRONICS AND PHOTONICS, 2008, : 169 - 175
  • [29] Effects of alloying elements in high reliability copper wire bond material for high temperature applications
    Eto, M.
    Araki, N.
    Yamada, T.
    Klengel, R.
    Klengel, S.
    Petzold, M.
    Sugiyama, M.
    Fujimoto, S.
    MICROELECTRONICS RELIABILITY, 2020, 114
  • [30] Die attach for fine pitch wire bond application
    Giguere, Eric
    Gauvin, Marco
    National Electronic Packaging and Production Conference-Proceedings of the Technical Program (West and East), 1999, 3 : 1229 - 1241