Charge-collection and single-event upset measurements at the ISIS neutron source

被引:0
|
作者
Platt, S. P. [1 ]
Torok, Z. [1 ]
Frost, C. D.
Ansell, S.
机构
[1] Univ Cent Lancashire, Sch Comp Engn & Phys Sci, Preston PR1 2HE, Lancs, England
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Charge-collection measurements at the VESUVIO instrument at ISIS are described. Neutron SEU cross-sections in SRAM-based FPGAs are measured. Results are compared to equivalent data from Los Alamos Neutron Science Center.
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页码:322 / +
页数:2
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