Biasing N-channel GaAs MESFETs

被引:0
|
作者
Bonn, F [1 ]
机构
[1] Motorola SPS, Wireless Infrastruct Syst Div, Tempe, AZ USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
THIS article discusses the basic problem of DC-current stabilization in n-channel, metal-semiconductor field-effect transistors (MESFETs) due to device-threshold variations. It introduces basic methods of V-th compensation through gate- and source-voltage control, analyzes several methods of compensation, and discusses their relative merits.
引用
收藏
页码:81 / +
页数:9
相关论文
共 50 条
  • [31] Inversion mode n-channel GaAs field effect transistor with high-k/metal gate
    De Souza, J. P.
    Kiewra, E.
    Sun, Y.
    Callegari, A.
    Sadana, D. K.
    Shahidi, G.
    Webb, D. J.
    Fompeyrine, J.
    Germann, R.
    Rossel, C.
    Marchiori, C.
    APPLIED PHYSICS LETTERS, 2008, 92 (15)
  • [32] OBSERVATION OF NEGATIVE PERSISTENT PHOTOCONDUCTIVITY IN AN N-CHANNEL GAAS/ALXGA1-XAS SINGLE HETEROJUNCTION
    CHEN, J
    YANG, CH
    WILSON, RA
    YANG, MJ
    APPLIED PHYSICS LETTERS, 1992, 60 (17) : 2113 - 2115
  • [33] COMPARISON OF MG AND ZN GATE IMPLANTS FOR GAAS N-CHANNEL JUNCTION FIELD-EFFECT TRANSISTORS
    SHERWIN, ME
    ZOLPER, JC
    BACA, AG
    DRUMMOND, TJ
    SHUL, RJ
    HOWARD, AJ
    RIEGER, DJ
    SCHNEIDER, RP
    KLEM, JF
    JOURNAL OF ELECTRONIC MATERIALS, 1994, 23 (08) : 809 - 818
  • [34] BURIED CHANNEL GAAS-MESFETS - SCATTERING PARAMETER AND LINEARITY DEPENDENCE ON THE CHANNEL DOPING PROFILE
    DEKKERS, JJM
    PONSE, F
    BENEKING, H
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (09) : 1065 - 1070
  • [35] Cryogenic operation of asymmetric n-channel IGBTs
    North Carolina State Univ, Raleigh, United States
    Solid State Electron, 3 (561-566):
  • [36] HIGH SIDE SWITCHING WITH N-CHANNEL MOSFETS
    KERR, JW
    ELECTRONIC PRODUCTS MAGAZINE, 1984, 26 (11): : 115 - 118
  • [37] Analysis of quantum yield in n-channel MOSFETs
    Spinelli, AS
    Ielmini, D
    Lacaita, AL
    Sebastiani, A
    Ghidini, G
    41ST ANNUAL PROCEEDINGS: INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2003, : 412 - 416
  • [38] CRYOGENIC OPERATION OF ASYMMETRIC N-CHANNEL IGBTS
    SINGH, R
    BALIGA, BJ
    SOLID-STATE ELECTRONICS, 1995, 38 (03) : 561 - 566
  • [39] Degradation mechanisms in SOI n-channel LDMOSFETs
    Vandooren, A
    Conley, JF
    Cristoloveanu, S
    Mojarradi, M
    Kolawa, E
    MICROELECTRONIC ENGINEERING, 2001, 59 (1-4) : 489 - 495
  • [40] COUPLED EQUATIONS FOR N-CHANNEL SCATTERING PROBLEM
    KOURI, DJ
    LEVIN, FS
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (04): : 489 - 489