Modeling and Simulation of a SiC BJT

被引:0
|
作者
Gachovska, T. K. [1 ]
Du, B. [5 ]
Hudgins, J. L. [1 ]
Grekov, A. [2 ]
Bryant, A. [3 ]
Santi, E. [2 ]
Mantooth, H. A. [4 ]
Agarwal, A. [6 ]
机构
[1] Univ Nebraska, Dept Elect Engn, Lincoln, NE 68588 USA
[2] Univ S Carolina, Dept Elect Engn, Columbia, SC 29208 USA
[3] Univ Warwick, Sch Engn, Coventry CV4 7AL, W Midlands, England
[4] Univ Arkansas, Dept Elect Engn, Fayetteville, AR 72701 USA
[5] Danfoss Inc, Danfoss Dr Div, Ljubljana 61111, Slovenia
[6] Cree Inc, Durham, NC 27703 USA
关键词
SiC BJT; Modeling; Simulation; Fourier Series; IGBT; DIODE;
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
The objective of this study was to develop a physics-based model of a SiC BJT and verify its validity through experimental testing. Two physical models were considered: a lumped charge model and the Fourier series solution used to solve the ambipolar diffusion equation (ADE). These models were realized using Matlab and Simulink. The simulation and experimental results of static and switching waveforms are given.
引用
收藏
页码:487 / +
页数:2
相关论文
共 50 条
  • [41] A 4H-SiC BJT with an epitaxially regrown extrinsic base layer
    Danielsson, E
    Domeij, M
    Lee, HS
    Zetterling, CM
    Östling, M
    Schöner, A
    Hallin, C
    SILICON CARBIDE AND RELATED MATERIALS 2004, 2005, 483 : 905 - 908
  • [42] HIGH CURRENT GAIN 4H-SIC BJT WITH ION IMPLANTATION
    Tajima, Taku
    Nakamura, Tadashi
    Watabe, Yuki
    Satoh, Masataka
    Nakamura, Tohru
    REPORT OF RESEARCH CENTER OF ION BEAM TECHNOLOGY, HOSEI UNIVERSITY, SUPPL NO 28, 2010, 28 : 89 - 92
  • [43] 4H-SiC BJT的Early电压分析
    韩茹
    李聪
    杨银堂
    贾护军
    半导体学报, 2007, (09) : 1433 - 1437
  • [44] The effect of the surface recombination on current gain for 4H-SiC BJT
    Zhang, Yourun
    Zhang, Bo
    Li, Zhaoji
    Deng, Xiaochuan
    Liu, Xilin
    2009 IEEE INTERNATIONAL CONFERENCE OF ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC 2009), 2009, : 491 - 494
  • [45] A New Proportional Base Driver Technique for Minimizing Driver Loss of SiC BJT
    Liang, Shiwei
    Deng, Linfeng
    Peng, Zhigao
    Shi, Yize
    Shen, Z. John
    Wang, Jun
    2018 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2018, : 5485 - 5488
  • [46] 考虑非线性结电容的SiC BJT模型改进
    孙静
    熊伟
    谢斌
    陈山源
    湖南工程学院学报(自然科学版), 2022, 32 (02) : 1 - 6
  • [47] 4H-SiC BJT characterization at high current high voltage
    Gao, Yan
    Huang, Alex Q.
    Xu, Xiaojun
    Du, Zhong
    Agarwal, Anant K.
    Krishnaswami, Sumi
    Ryu, Sei-Hyung
    2006 IEEE POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-7, 2006, : 2932 - +
  • [48] Electro-Thermal Modeling of SiC Power Devices for Circuit Simulation
    Yin, Shan
    Wang, Tao
    Tseng, K. J.
    Zhao, Jiyun
    Hu, Xiaolei
    39TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY (IECON 2013), 2013, : 718 - 723
  • [49] Modeling and simulation of carrier transport properties in 4H-SiC
    Tanaka, Hajime
    Mori, Nobuya
    2024 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI TSA, 2024,
  • [50] Aging Modeling and Simulation of the Gate Switching Instability Degradation in SiC MOSFETs
    Garcia-Mere, Juan R.
    Gomez, Alexis A.
    Roig-Guitart, Jaume
    Rodriguez, Juan
    Rodriguez, Alberto
    2024 IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, APEC, 2024, : 653 - 658