Optical characterization of AlxGa1-xSb/GaSb epitaxial layers

被引：0

作者：

DiLernia, S ^{[1
]}

Geddo, M ^{[1
]}

Guizzetti, G ^{[1
]}

Patrini, M ^{[1
]}

Bosacchi, A ^{[1
]}

Franchi, S ^{[1
]}

Magnanini, R ^{[1
]}

机构：

[1] UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY

来源：

DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS PROCESSING II | 1996年 / 406卷

关键词：

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：389 / 394

页数：6

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