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Optical characterization of AlxGa1-xSb/GaSb epitaxial layers
被引:0
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作者
:
DiLernia, S
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0
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0
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0
机构:
UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY
UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY
DiLernia, S
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1
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Geddo, M
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Guizzetti, G
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1
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Patrini, M
[
1
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Bosacchi, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY
UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY
Bosacchi, A
[
1
]
Franchi, S
论文数:
0
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0
h-index:
0
机构:
UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY
UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY
Franchi, S
[
1
]
Magnanini, R
论文数:
0
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0
h-index:
0
机构:
UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY
UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY
Magnanini, R
[
1
]
机构
:
[1]
UNIV PAVIA,DIPARTIMENTO FIS A VOLTA,INFM,I-27100 PAVIA,ITALY
来源
:
DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS PROCESSING II
|
1996年
/ 406卷
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:
D O I
:
暂无
中图分类号
:
TB3 [工程材料学];
学科分类号
:
0805 ;
080502 ;
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:
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页码:389 / 394
页数:6
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