共 50 条
- [31] Electromigration Behavior in Sn-37Pb and Sn-3.0Ag-0.5Cu Flip-Chip Solder Joints under High Current Density Journal of Electronic Materials, 2009, 38 : 70 - 77
- [32] Microstructure evolution and mechanical property of Sn-37Pb and Sn-3.0Ag-0.5Cu BGA solder joints under extreme temperature environment 2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017, : 473 - 476
- [34] Damage Produced in Solder Alloys during Thermal Cycling Journal of Electronic Materials, 2007, 36 : 1111 - 1120
- [37] Kinetics of intermetallic formation at Sn-37Pb/Cu interface during reflow soldering Journal of Electronic Materials, 2002, 31 : 576 - 583
- [38] MICROSTRUCTURAL EVOLUTION DURING THERMOMECHANICAL FATIGUE OF 62SN-36PB-2AG AND 60SN-40PB SOLDER JOINTS IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1990, 13 (04): : 718 - 726
- [39] Mechanisms of thermal cycling damage in polycrystalline Sn-rich solder joints MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2020, 771
- [40] Reliability of electroplated Sn-37Pb solder bumps with different under bump metallizations (UBMs) during high temperature storage test ADVANCES IN NANOMATERIALS AND PROCESSING, PTS 1 AND 2, 2007, 124-126 : 5 - +