Damage produced in model solder (Sn-37Pb) joints during thermomechanical cycling

被引:13
|
作者
Liu, XW [1 ]
Plumbridge, WJ [1 ]
机构
[1] Open Univ, Dept Mat Engn, Milton Keynes MK7 6AA, Bucks, England
关键词
Sn-Pb solder; model joint; thermomechanical cycling; microstructure;
D O I
10.1007/s11664-003-0222-z
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The microstructure of solder plays a key role in the reliability of electronic packages. In this study, the cyclic shear deformation experienced by Sn-37Pb solder joints was simulated by thermomechanically cycling model joints between 30degreesC and 125degreesC, and the nature of the damage investigated. Most of the developed shear strain was accommodated by the solder adjacent to the interface with the intermetallic layer, and its severity diminished exponentially with distance from the interface. Shear bands formed at this location and within the shear bands, significant microstructural coarsening occurred together with crack initiation on the outer free surface of the solder. Subsequent cycling produced multiple cracking, fragmentation, and macroscopic decohesion, progressing toward the interior of the solder. Secondary cracks initiated from the primary cracks and propagated along colony boundaries in the surface layers of the solder perpendicular to the shear direction. In the interior of the solder, well away from the interface with the intermetallic layer, a limited amount of coarsening occurred. Apart from smoothing of undulations, the intermetallic layer was unaffected.
引用
收藏
页码:278 / 286
页数:9
相关论文
共 50 条
  • [31] Electromigration Behavior in Sn-37Pb and Sn-3.0Ag-0.5Cu Flip-Chip Solder Joints under High Current Density
    Sang-Su Ha
    Jong-Woong Kim
    Jeong-Won Yoon
    Sang-Ok Ha
    Seung-Boo Jung
    Journal of Electronic Materials, 2009, 38 : 70 - 77
  • [32] Microstructure evolution and mechanical property of Sn-37Pb and Sn-3.0Ag-0.5Cu BGA solder joints under extreme temperature environment
    Tian, Ruyu
    Hang, Chunjin
    Tian, Yanhong
    Zhao, Liyou
    2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017, : 473 - 476
  • [33] Damage produced in solder alloys during thermal cycling
    Liu, X. W.
    Plumbridge, W. J.
    JOURNAL OF ELECTRONIC MATERIALS, 2007, 36 (09) : 1111 - 1120
  • [34] Damage Produced in Solder Alloys during Thermal Cycling
    X.W. LIU
    W.J. PLUMBRIDGE
    Journal of Electronic Materials, 2007, 36 : 1111 - 1120
  • [35] Experiments and simulations of uniaxial ratchetting deformation of Sn-3Ag-0.5Cu and Sn-37Pb solder alloys
    Kobayashi, Takuji
    Sasaki, Katsuhiko
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2009, 20 (04) : 343 - 353
  • [36] Influence of microstructure coarsening on thermomechanical fatigue behavior of Pb/Sn eutectic solder joints
    Tang, H
    Basaran, C
    INTERNATIONAL JOURNAL OF DAMAGE MECHANICS, 2001, 10 (03) : 235 - 255
  • [37] Kinetics of intermetallic formation at Sn-37Pb/Cu interface during reflow soldering
    Jong-Hyun Lee
    Yong-Seog Kim
    Journal of Electronic Materials, 2002, 31 : 576 - 583
  • [38] MICROSTRUCTURAL EVOLUTION DURING THERMOMECHANICAL FATIGUE OF 62SN-36PB-2AG AND 60SN-40PB SOLDER JOINTS
    FREAR, DR
    IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1990, 13 (04): : 718 - 726
  • [39] Mechanisms of thermal cycling damage in polycrystalline Sn-rich solder joints
    Kelly, Marion Branch
    Kirubanandham, Antony
    Chawla, Nikhilesh
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2020, 771
  • [40] Reliability of electroplated Sn-37Pb solder bumps with different under bump metallizations (UBMs) during high temperature storage test
    Koo, Ja-Myeong
    Kim, Dea-Gon
    Jung, Seung-Boo
    ADVANCES IN NANOMATERIALS AND PROCESSING, PTS 1 AND 2, 2007, 124-126 : 5 - +