Residual stress estimation of ceramic thin films by X-ray diffraction and indentation techniques

被引：55

作者：

Atar, E

Sarioglu, C

Demirler, U

Kayali, ES

Cimenoglu, H ^{[1
]}

机构：

[1] Istanbul Tech Univ, Dept Met & Mat Engn, TR-34469 Istanbul, Turkey

[2] Gebze Inst Technol, Dept Mat Sci & Engn, TR-41400 Gebze, Kocaeli, Turkey

[3] Marmara Univ, Dept Met & Mat Engn, TR-81040 Istanbul, Turkey

来源：

SCRIPTA MATERIALIA | 2003年 / 48卷 / 09期

关键词：

microindentation; residual stresses; thin films; X-ray diffraction;

D O I：

10.1016/S1359-6462(03)00019-8

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The residual stresses in ceramic thin films obtained by the indentation method have been found to be three times higher than those of the X-ray diffraction method. This discrepancy can be eliminated by setting the geometrical factor for the Vickers pyramid indenter to 1 in the relevant equation of the indentation method. (C) 2003 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.

引用

页码：1331 / 1336

页数：6

共 50 条

[31] Measuring casting residual stress with X-ray diffraction
Modern Casting, 2005, 95 (09) : 48 - 49
[32] X-RAY DIFFRACTION ANALYZES RESIDUAL SURFACE STRESS
RENSHAW, TA
SPACE AERONAUTICS, 1969, 52 (03): : 60 - &
[33] Residual stress and microstructure analysis with X-ray diffraction
He, Bob Baoping
PROCEEDINGS OF THE SIXTEENTH (2006) INTERNATIONAL OFFSHORE AND POLAR ENGINEERING CONFERENCE, VOL 4, 2006, : 37 - 42
[34] Residual Stress Measurement using X-Ray Diffraction Techniques, Guidelines and Normative Standards
Belassel, Mohammed
SAE INTERNATIONAL JOURNAL OF MATERIALS AND MANUFACTURING, 2012, 5 (02) : 352 - 356
[35] A comparison of residual stress measurements in steels using the X-ray and the neutron diffraction techniques
Celard, NJ
Pathiraj, B
Nikbin, K
Webster, GA
ECRS 5: PROCEEDINGS OF THE FIFTH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2000, 347-3 : 316 - 321
[36] Comparison of residual stress measurements in steels using the X-ray and the neutron diffraction techniques
Department of Mechanical Engineering, Imperial College, London, SW7 2BX, United Kingdom
不详
Materials Science Forum, 2000, 347 : 316 - 321
[37] FUNDAMENTALS AND BASIC TECHNIQUES OF RESIDUAL STRESS MEASUREMENTS WITH A PORTABLE X-RAY DIFFRACTION UNTI
HOMICZ, RJ
SAE TRANSACTIONS, 1968, 76 : 83 - &
[38] Review of residual stress determination and exploitation techniques using x-ray diffraction method
Belassel, M.
Pineault, J.
Brauss, M. E.
RESIDUAL STRESSES VII, 2006, 524-525 : 229 - 234
[39] X-Ray Measurement of Residual Stress Distribution in Sputtered Cu Thin Films
Akiniwa, Yoshiaki
Sakaue, Taku
THERMEC 2011, PTS 1-4, 2012, 706-709 : 1649 - +
[40] Residual stress of aluminum thin films measured by X-ray and curvature methods
Tanaka, K
Ishihara, K
Akiniwa, Y
Ohta, H
MATERIALS SCIENCE RESEARCH INTERNATIONAL, 1996, 2 (03): : 153 - 159

← 1 2 3 4 5 →