GISAXS analysis of the precipitates in GeMn thin layers.

被引:0
|
作者
Vales, Vaclav [1 ]
Holy, Vaclav [1 ]
Lechner, Rainer T. [2 ]
机构
[1] Charles Univ Prague, Dept Condensed Matter Phys, Prague, Czech Republic
[2] Kepler Univ Linz, Inst Semicond Phys, Linz, Austria
关键词
GeMn; GISAXS; precipitates;
D O I
10.1107/S0108767310093116
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
FA5-MS39-P
引用
收藏
页码:S300 / S300
页数:1
相关论文
共 50 条
  • [41] SURFACE-STATE GENERATED CURRENTS IN THIN SEMICONDUCTOR LAYERS.
    Gusev, M.Yu.
    Zyuganov, A.N.
    Koren', N.N.
    Smertenko, P.S.
    Soviet journal of communications technology & electronics, 1987, 32 (02): : 108 - 113
  • [42] On the influence of different substances on the absorption of light by thin tungsten layers.
    Hamburger, L
    Holst, G
    Lely, D
    Oosterhuis, E
    PROCEEDINGS OF THE KONINKLIJKE AKADEMIE VAN WETENSCHAPPEN TE AMSTERDAM, 1919, 21 (6/10): : 1078 - 1088
  • [43] Rapid Determination of Concentration and Mobility Profiles on Thin GaAs Layers.
    Binet, Michel
    Acta electronica Paris, 1980, 23 (01): : 53 - 61
  • [44] Surface phenomena in the crystallisation of undercooled liquids in thin layers. II
    Michnewitsch, GL
    Browko, IE
    ACTA PHYSICOCHIMICA URSS, 1938, 8 : 103 - 112
  • [45] About new resonances in the absorption spectrum of thin metal layers.
    Wolter, H.
    ZEITSCHRIFT FUR PHYSIK, 1939, 113 (9-10): : 547 - 553
  • [46] Analysis of Changes in Absorption in Photocrosslinked Polymer Layers.
    Paczkowski, Jerzy
    Sierocka, Michalina
    Polimery/Polymers, 1978, 23 (01) : 5 - 7
  • [47] Two-scale analysis for very rough thin layers. An explicit characterization of the polarization tensor
    Ciuperca, Ionel Sorin
    Perrussel, Ronan
    Poignard, Clair
    JOURNAL DE MATHEMATIQUES PURES ET APPLIQUEES, 2011, 95 (03): : 277 - 295
  • [48] Electron Microscopic Investigation of Sputtered and Electrolytically Deposited Thin Magnetic Layers.
    Pape, Karin
    Hieber, Hartmann
    Praktische Metallographie/Practical Metallography, 1974, 11 (01): : 10 - 18
  • [49] USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS.
    Pogrebnyak, A.D.
    Kuz'minykh, V.A.
    Aref'ev, K.P.
    Soviet physics. Technical physics, 1981, 26 (09): : 1128 - 1130
  • [50] Developement of advanced materials for fabricating thin-film absorber layers.
    Banger, KK
    Jin, MH
    Harris, JD
    Cowen, JE
    Hepp, AF
    PROCEEDINGS OF 3RD WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION, VOLS A-C, 2003, : 426 - 429