On-site comparison of quantum Hall effect resistance standards of the KRISS and the BIPM: ongoing key comparison BIPM.EM-K12

被引：4
|
作者：
Gournay, P. [1 ]
Rolland, B. [1 ]
Chae, D-H [2 ]
Kim, W-S [2 ]
机构：
[1] Bur Int Poids & Mesures BIPM, Pavillon Breteuil, F-92312 Sevres, France
[2] Korea Res Inst Stand & Sci KRISS, 267 Gajeong Ro, Daejeon 34113, South Korea
来源：
METROLOGIA | 2020年 / 57卷 / 1A期
关键词：
22;
D O I：
10.1088/0026-1394/57/1A/01010
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
[No abstract available]
引用
收藏
页数：2
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