Stability measurements of frequency synthesis with cryogenic sapphire oscillators

被引：2
|
作者：
Hartnett, John G. [1 ]
Creedon, Daniel [1 ]
Chambon, D. [2 ]
Santarelli, G. [2 ]
机构：
[1] Univ Western Australia, Sch Phys, 35 Stirling Hwy, Crawley, WA 6009, Australia
[2] Observ Paris, Lab Natl Metrol & Essais Syst, Reference Temps Espace, F-75014 Paris, France
来源：
2009 JOINT MEETING OF THE EUROPEAN FREQUENCY AND TIME FORUM AND THE IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM, VOLS 1 AND 2 | 2009年
关键词：
cryogenic sapphire oscillator; frequency synthesis; Allan deviation; phase noise;
D O I：
10.1109/FREQ.2009.5168203
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report on the latest cryogenic sapphire oscillator the developed at the University of Western Australia and the use of two nominally identical cryogenic oscillators to evaluate frequency synthesis configurations using a down converter. The down converter is used to make comparisons between microwave clocks at different frequencies, where the synthesized signal has a stability not significantly different from the reference oscillator.
引用
收藏
页码：372 / +
页数：2
相关论文
共 50 条
  • [1] Short term frequency stability tests of two cryogenic sapphire oscillators
    Watabe, Ken-ichi
    Hartnett, John G.
    Locke, Clayton R.
    Santarelli, Giorgio
    Yanagimachi, Shinya
    Shimazaki, Takeshi
    Ikegami, Takeshi
    Ohshima, Shin-ichi
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (12): : 9234 - 9237
  • [2] Short term frequency stability tests of two cryogenic sapphire oscillators
    Watabe, Ken-Ichi
    Hartnett, John G.
    Locke, Clayton R.
    Santarelli, Giorgio
    Yanagimachi, Shinya
    Shimazaki, Takeshi
    Ikegami, Takeshi
    Ohshima, Shin-Ichi
    [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2006, 45 (12): : 9235 - 9237
  • [3] Generation of 100 GHz with Parts in 1016 Frequency Stability Using Cryogenic Sapphire Oscillators
    Bara, Romain
    Le Floch, Jean-Michel
    Tobar, Michael E.
    Stanwix, Paul L.
    Parker, Stephen
    Hartnett, John G.
    Ivanov, Eugene N.
    [J]. 2011 JOINT CONFERENCE OF THE IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM/EUROPEAN FREQUENCY AND TIME FORUM PROCEEDINGS, 2011, : 193 - 194
  • [4] Frequency stability and phase noise of a pair of X-band cryogenic sapphire oscillators
    Marra, Giuseppe
    Henderson, Dale
    Oxborrow, Mark
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2007, 18 (05) : 1224 - 1228
  • [5] CRYOGENIC SAPPHIRE OSCILLATORS
    Hartnett, J. G.
    Ivanov, E. N.
    Tobar, M. E.
    [J]. PROCEEDINGS OF THE 7TH SYMPOSIUM FREQUENCY STANDARDS AND METROLOGY, 2009, : 384 - 392
  • [6] Cryogenic sapphire oscillator with improved frequency stability
    Chang, S
    Mann, AG
    Luiten, AN
    [J]. PROCEEDINGS OF THE 2000 IEEE/EIA INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM & EXHIBITION, 2000, : 475 - 479
  • [7] Frequency Stability Measurement of Cryogenic Sapphire Oscillators With a Multichannel Tracking DDS and the Two-Sample Covariance
    Calosso, Claudio E.
    Vernotte, Francois
    Giordano, Vincent
    Fluhr, Christophe
    Dubois, Benoit
    Rubiola, Enrico
    [J]. IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 2019, 66 (03) : 616 - 623
  • [8] Radio frequency signals synthesised from independent cryogenic sapphire oscillators
    Hartnett, J. G.
    Parker, S. R.
    Ivanov, E. N.
    Povey, T.
    Nand, N. R.
    le Floch, J-M
    [J]. ELECTRONICS LETTERS, 2014, 50 (04) : 294 - U137
  • [9] Frequency Synthesis from Cryogenic Sapphire Oscillator
    Vaillant, Etienne
    Sthal, Fabrice
    Imbaud, Joel
    Gruson, Yannick
    Fluhr, Christophe
    Grop, Serge
    Giordano, Vincent
    Rubiola, Enrico
    Esnault, Francois-Xavier
    Cibiel, Gilles
    [J]. 2016 EUROPEAN FREQUENCY AND TIME FORUM (EFTF), 2016,
  • [10] Cryogenic sapphire oscillator with exceptionally high frequency stability
    Mann, AG
    Sheng, C
    Luiten, AN
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (02) : 519 - 521
12345