Cryogenic sapphire oscillator with exceptionally high frequency stability

被引：40
|
作者：
Mann, AG [1 ]
Sheng, C [1 ]
Luiten, AN [1 ]
机构：
[1] Univ Western Australia, Dept Phys, Nedlands, WA 6907, Australia
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2001年 / 50卷 / 02期
基金：
澳大利亚研究理事会;
关键词：
cryogenic electronics; dielectric resonators; frequency measurement; frequency stability; microwave oscillators; microwave resonators; oscillator stability; phase noise; sapphire;
D O I：
10.1109/19.918181
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4 X 10(-16)tau (-1/2) for integration times (tau) of 1 to 4 s and a minimum of 2.4 x 10(-16) at 32 s. For integration times longer than 100 s, the frequency stability is approximately 3 x 10(-17)tau (1/2) and the relative drift per day is about 10(-13) This stability is the best reported to date for any microwave source over integration times less than 100 s.
引用
收藏
页码：519 / 521
页数：3
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