Resonator power to frequency conversion in a cryogenic sapphire oscillator

被引：13
|
作者：
Nand, Nitin R. [1 ]
Parker, Stephen R. [2 ,3 ]
Ivanov, Eugene N. [1 ]
le Floch, Jean-Michel [1 ]
Hartnett, John G. [2 ,3 ]
Tobar, Michael E. [1 ]
机构：
[1] Univ Western Australia, Sch Phys, ARC Ctr Excellence Engn Quantum Syst, Crawley, WA 6009, Australia
[2] Univ Western Australia, Sch Phys, Crawley, WA 6009, Australia
[3] Univ Adelaide, Sch Chem & Phys, Inst Photon & Adv Sensing, Adelaide, SA 5005, Australia
来源：
APPLIED PHYSICS LETTERS | 2013年 / 103卷 / 04期
基金：
澳大利亚研究理事会;
关键词：
NOISE;
D O I：
10.1063/1.4816284
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency. (C) 2013 AIP Publishing LLC.
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页数：4
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