Resonator power to frequency conversion in a cryogenic sapphire oscillator

被引：13

作者：

Nand, Nitin R. ^{[1
]}

Parker, Stephen R. ^{[2
,3
]}

Ivanov, Eugene N. ^{[1
]}

le Floch, Jean-Michel ^{[1
]}

Hartnett, John G. ^{[2
,3
]}

Tobar, Michael E. ^{[1
]}

机构：

[1] Univ Western Australia, Sch Phys, ARC Ctr Excellence Engn Quantum Syst, Crawley, WA 6009, Australia

[2] Univ Western Australia, Sch Phys, Crawley, WA 6009, Australia

[3] Univ Adelaide, Sch Chem & Phys, Inst Photon & Adv Sensing, Adelaide, SA 5005, Australia

来源：

APPLIED PHYSICS LETTERS | 2013年 / 103卷 / 04期

基金：

澳大利亚研究理事会;

关键词：

NOISE;

D O I：

10.1063/1.4816284

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of -0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency. (C) 2013 AIP Publishing LLC.

引用

页数：4

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