Effect of grain size on the ferroelectric properties of Bi3.25La0.75Ti3O12 thin films

被引:10
|
作者
Kim, KT
Kim, CI
Kang, DH
Shim, IW
机构
[1] Chung Ang Univ, Sch Elect & Elect Engn, Dongjak Gu, Seoul 156756, South Korea
[2] Chung Ang Univ, Dept Chem, Dongjak Gu, Seoul 156756, South Korea
来源
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 2002年 / 16卷 / 28-29期
关键词
D O I
10.1142/S0217979202015637
中图分类号
O59 [应用物理学];
学科分类号
摘要
The Bi3.25La0.75Ti3O12 (BLT) thin films were prepared by metalorganic decomposition method The effect of grain size on ferroelectric properties' during crystallization were investigated by x-ray diffraction and field emission scanning electron microscope. The grain size and the roughness of BLT films increase with increasing of drying temperature. The leakage current densities of the BLT thin film with large grains are higher than that with small grains. The remanent polarization of BLT increases with increasing grain size. As compared BLT with,small grain size, the BLT film with larger grain size shows better fatigue properties. This may be explained that small grained films shows more degradation of switching charge than large grained films.
引用
收藏
页码:4469 / 4474
页数:6
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