Annealing Temperature Effect on Internal Strain and Ferroelectric Properties of Bi3.25La0.75Ti3O12 Thin Films

被引：1
|
作者：
Wu, Xiumei [1 ]
Kan, Yi [2 ]
Lu, Xiaomei [2 ]
Zhu, Jinsong [2 ]
Zhai, Ya [1 ]
机构：
[1] Southeast Univ, Dept Phys, Nanjing 211189, Peoples R China
[2] Nanjing Univ, Nanjing Natl Lab Microstruct, Dept Phys, Nanjing 210093, Peoples R China
来源：
FERROELECTRICS | 2010年 / 400卷
基金：
美国国家科学基金会;
关键词：
Ferroelectric thin films; strain impact; polarization; DOMAINS;
D O I：
10.1080/00150193.2010.505786
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The annealing temperature impact on the internal strain and the ferroelectric properties of Bi3.25La0.75Ti3O12 thin films was studied. It is found that, with the annealing temperature increasing, the internal strain in films first decreases (below 720 degrees C) and then increases (at 750 degrees C), while the volume fraction of a-axis-oriented grains, the remnant polarization and the coercive field first increase (below 720 degrees C) and then decrease (at 750 degrees C). These experimental results show that the properties of the Bi3.25La0.75Ti3O12 thin films can be directly influenced by the annealing temperature.
引用
收藏
页码：263 / 268
页数：6
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