Spatially-resolved imaging of microprocessor power (SIMP): Hotspots in microprocessors.

In this paper we present the details of a new technique, which allows for spatially-resolved imaging of microprocessor power (SIMP) under full operational conditions. The method involves two steps: In the first step it utilizes infra-red (IR) thermal imaging, while an IR-transparent coolant flows through a specially designed cooling cell directly over the microprocessor. In the second step the underlying power distribution is derived by determining the temperature fields for each individual power source on the chip. The measured chip temperature distribution is then represented as a superposition of these temperature fields. The SIMP data reveals significant temporal and spatial variations of the microprocessor power/temperature distribution, which can be attributed to the circuit layout as well as to the varying utilization levels across the processor while running real work-loads. More specifically, strong non-uniformities or hotspots in the microprocessor power distributions are observed, which have significant implications for pack-aging and cooling designs.