Multilayer Optics for X-ray Analytical Equipment - The past, the present and the future.

被引：0
|
作者：
Wiesmann, Joerg [1 ]
Kleine, Andreas [1 ]
Hasse, Bernd [1 ]
Graf, Juergen [1 ]
Heidorn, Uwe [1 ]
Kroth, Steffen [1 ]
Hertlein, Frank [1 ]
Michaelsen, Carsten [1 ]
机构：
[1] Incoatec GmbH, Geesthacht, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2012年 / 68卷
关键词：
X-ray optics; multilayer thin films; new XRD technology;
D O I：
10.1107/S0108767312097413
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS50-03
引用
收藏
页码：S134 / S134
页数：1
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