Multilayer Optics for X-ray Analytical Equipment - The past, the present and the future.

被引:0
|
作者
Wiesmann, Joerg [1 ]
Kleine, Andreas [1 ]
Hasse, Bernd [1 ]
Graf, Juergen [1 ]
Heidorn, Uwe [1 ]
Kroth, Steffen [1 ]
Hertlein, Frank [1 ]
Michaelsen, Carsten [1 ]
机构
[1] Incoatec GmbH, Geesthacht, Germany
关键词
X-ray optics; multilayer thin films; new XRD technology;
D O I
10.1107/S0108767312097413
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
MS50-03
引用
收藏
页码:S134 / S134
页数:1
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