Multilayer Optics for X-ray Analytical Equipment - The past, the present and the future.

被引：0

作者：

Wiesmann, Joerg ^{[1
]}

Kleine, Andreas ^{[1
]}

Hasse, Bernd ^{[1
]}

Graf, Juergen ^{[1
]}

Heidorn, Uwe ^{[1
]}

Kroth, Steffen ^{[1
]}

Hertlein, Frank ^{[1
]}

Michaelsen, Carsten ^{[1
]}

机构：

[1] Incoatec GmbH, Geesthacht, Germany

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2012年 / 68卷

关键词：

X-ray optics; multilayer thin films; new XRD technology;

D O I：

10.1107/S0108767312097413

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

MS50-03

引用

页码：S134 / S134

页数：1

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