A negative ion source test facility

被引：3
|
作者：
Melanson, S. [1 ]
Dehnel, M. [1 ]
Potkins, D. [1 ]
Theroux, J. [1 ]
Hollinger, C. [1 ]
Martin, J. [1 ]
Philpott, C. [2 ]
Stewart, T. [1 ]
Jackle, P. [1 ]
Williams, P. [1 ,2 ]
Brown, S. [2 ]
Jones, T. [2 ]
Coad, B. [2 ]
Withington, S. [1 ]
机构：
[1] D Pace Inc, POB 201, Nelson, BC V1L 5P9, Canada
[2] Buckley Syst Ltd, 6 Bowden Rd, Auckland 1060, New Zealand
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 02期
关键词：
BEAM DEPOSITION;
D O I：
10.1063/1.4932320
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Progress is being made in the development of an Ion Source Test Facility (ISTF) by D-Pace Inc. in collaboration with Buckley Systems Ltd. in Auckland, NZ. The first phase of the ISTF is to be commissioned in October 2015 with the second phase being commissioned in March 2016. The facility will primarily be used for the development and the commercialization of ion sources. It will also be used to characterize and further develop various D-Pace Inc. beam diagnostic devices. (C) 2015 AIP Publishing LLC.
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页数：3
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