Coalescence and sintering of Pt nanoparticles: in situ observation by aberration-corrected HAADF STEM

被引:136
|
作者
Asoro, M. A. [1 ]
Kovar, D. [1 ,2 ]
Shao-Horn, Y. [3 ,4 ]
Allard, L. F. [5 ]
Ferreira, P. J. [1 ,2 ]
机构
[1] Univ Texas Austin, Mat Sci & Engn Program, Austin, TX 78712 USA
[2] Univ Texas Austin, Dept Mech Engn, Austin, TX 78712 USA
[3] MIT, Dept Mech Engn, Cambridge, MA 02139 USA
[4] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
[5] Oak Ridge Natl Lab, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA
基金
美国国家科学基金会;
关键词
SURFACE-DIFFUSION; PLATINUM; TEMPERATURE; INSTABILITY;
D O I
10.1088/0957-4484/21/2/025701
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
An aberration-corrected JEOL 2200FS scanning-transmission electron microscope (STEM), equipped with a high-angle annular dark-field detector (HAADF), is used to monitor the coalescence and sintering of Pt nanoparticles with an average diameter of 2.8 nm. This in situ STEM capability is combined with an analysis methodology that together allows direct measurements of mass transport phenomena that are important in understanding how particle size influences coalescence and sintering at the nanoscale. To demonstrate the feasibility of this methodology, the surface diffusivity is determined from measurements obtained from STEM images acquired during the initial stages of sintering. The measured surface diffusivities are in reasonable agreement with measurements made on the surface of nanoparticles, using other techniques. In addition, the grain boundary mobility is determined from measurements made during the latter stages of sintering.
引用
收藏
页数:6
相关论文
共 50 条
  • [31] Aberration-corrected STEM: current performance and future directions
    Nellist, P. D.
    Chisholm, M. F.
    Lupini, A. R.
    Borisevich, A.
    Sides, W. H., Jr.
    Pennycook, S. J.
    Dellby, N.
    Keyse, R.
    Krivanek, O. L.
    Murfitt, M. F.
    Szilagyi, Z. S.
    EMAG-NANO 2005: IMAGING, ANALYSIS AND FABRICATION ON THE NANOSCALE, 2006, 26 : 7 - +
  • [32] Aberration-corrected STEM/TEM imaging at 15 kV
    Sasaki, Takeo
    Sawada, Hidetaka
    Hosokawa, Fumio
    Sato, Yuta
    Suenaga, Kazu
    ULTRAMICROSCOPY, 2014, 145 : 50 - 55
  • [33] Experimental evaluation of a spherical aberration-corrected TEM and STEM
    Sawada, H
    Tomita, T
    Naruse, M
    Honda, T
    Hambridge, P
    Hartel, P
    Haider, M
    Hetherington, C
    Doole, R
    Kirkland, A
    Hutchison, J
    Titchmarsh, J
    Cockayne, D
    JOURNAL OF ELECTRON MICROSCOPY, 2005, 54 (02) : 119 - 121
  • [34] Motion of gold atoms on carbon in the aberration-corrected STEM
    Batson, Philip E.
    MICROSCOPY AND MICROANALYSIS, 2008, 14 (01) : 89 - 97
  • [35] New insights into the structure of Pd-Au nanoparticles as revealed by aberration-corrected STEM
    Deepak, Francis Leonard
    Casillas-Garcia, Gilberto
    Esparza, Rodrigo
    Barron, H.
    Jose-Yacaman, Miguel
    JOURNAL OF CRYSTAL GROWTH, 2011, 325 (01) : 60 - 67
  • [36] Aberration-corrected HAADF-STEM investigations of precipitate structures in Al-Mg-Si alloys with low Cu additions
    Saito, Takeshi
    Marioara, Calin D.
    Andersen, Sigmund J.
    Lefebvre, Williams
    Holmestad, Randi
    PHILOSOPHICAL MAGAZINE, 2014, 94 (05) : 520 - 531
  • [37] Aberration-corrected HAADF-STEM investigations of precipitate structures in Al-Mg-Si alloys with low Cu additions
    Saito, Takeshi (takeshi.saito@ntnu.no), 1600, Taylor and Francis Ltd. (94):
  • [38] Aberration-corrected HAADF-STEM investigations of precipitate structures in Al-Mg-Si alloys with low Cu additions
    Saito, T. (takeshi.saito@ntnu.no), 1600, Taylor and Francis Ltd. (94):
  • [39] In-situ Synthesis of PtSn/C Fuel Cell Nanocatalysts in an Aberration-Corrected STEM/TEM
    Liu, Jingyue
    Braddock-Wilking, Janet
    Allard, Lawrence F.
    MICROSCOPY AND MICROANALYSIS, 2009, 15 : 688 - 689
  • [40] Imaging and spectroscopy of defects in semiconductors using aberration-corrected STEM
    van Benthem, Klaus
    Pennycook, Stephen J.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2009, 96 (01): : 161 - 169