Interface characterisations of dysprosium overlayers on tungsten(100)

被引：8
|
作者：
Moslemzadeh, N
Barrett, SD
Dhanak, VR
Miller, G
机构：
[1] Univ Liverpool, Surface Sci Res Ctr, Liverpool L69 3BX, Merseyside, England
[2] Univ Liverpool, Dept Phys, Liverpool L69 7ZE, Merseyside, England
[3] Daresbury Lab, Warrington WA4 4AD, Cheshire, England
来源：
VACUUM | 2002年 / 68卷 / 04期
关键词：
dysprosium; tungsten; synchrotron radiation photoelectron spectroscopy; metal-metal interfaces; metallic films;
D O I：
10.1016/S0042-207X(02)00539-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin films of Dy have been grown on a W(1 0 0) substrate and structural changes have been identified from core-level line-shape changes by monitoring the W 4f(7/2) core-level photoemission. Resolving the core-level line shapes after growth and during subsequent annealing, results in three additional W 4f(7/2) photoemission features that result from the interaction of Dy atoms with surface and subsurface W atoms. Interpretation of the intensity changes of these peaks during annealing provides structural information that complements parallel LEED, and XPS studies. (C) 2002 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：357 / 361
页数：5
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