Interface characterisations of dysprosium overlayers on tungsten(100)

Thin films of Dy have been grown on a W(1 0 0) substrate and structural changes have been identified from core-level line-shape changes by monitoring the W 4f(7/2) core-level photoemission. Resolving the core-level line shapes after growth and during subsequent annealing, results in three additional W 4f(7/2) photoemission features that result from the interaction of Dy atoms with surface and subsurface W atoms. Interpretation of the intensity changes of these peaks during annealing provides structural information that complements parallel LEED, and XPS studies. (C) 2002 Elsevier Science Ltd. All rights reserved.