IC mixed-signal BIST: Separating facts from fiction

被引：6
|
作者：
Sunter, SK [1 ]
机构：
[1] LogicVis Inc, San Jose, CA 95110 USA
来源：
INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS | 2002年
关键词：
D O I：
10.1109/TEST.2002.1041911
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
True built-in self-test (BIST) for complete test of 8∼16 bit ADCs and DACs is presently fiction. The reasons are technical and economic. It appears technically feasible to test most performance parameters for up to 12 bits accuracy, and some parameters beyond 12 bits. However, for an MS-BIST solution to be economically feasible it must overcome some obstacles. © 2002 IEEE.
引用
收藏
页码：1205 / 1205
页数：1
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