Properties of a-Se for use in flat panel X-ray image detectors

被引：27
|
作者：
Kasap, SO
Haugen, C
Nesdoly, M
Rowlands, JA
机构：
[1] Univ Saskatchewan, Dept Elect Engn, Saskatoon, SK S7N 5A9, Canada
[2] Univ Toronto, Sunnybrook Hlth Sci Ctr, Dept Med Biophys, Toronto, ON M4N 3N5, Canada
来源：
JOURNAL OF NON-CRYSTALLINE SOLIDS | 2000年 / 266卷
关键词：
D O I：
10.1016/S0022-3093(99)00954-0
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The present paper examines why a-Se has become the key photoconductor material in flat panel direct conversion X-ray image detectors. We critically examine the X-ray sensitivity of stabilized a-Se layers as a function of electric field and mean photon energy. The radiation energy W+/- absorbed per free electron-hole pair liberated for photoconduction in both a-Se and a-Si:H seem to follow the Que-Rowlands rule of W+/- approximate to 2.2 E-g + E-phonon for amorphous semiconductors. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
下载
收藏
页码：1163 / 1167
页数：5
相关论文
共 50 条
  • [41] Image Verification Accuracy of a Novel Patient Positioning System with Four X-Ray Tubes and Flat Panel Detectors in First Clinical use of the World
    Kawaguchi, G.
    Umetsu, O.
    Tanabe, S.
    Utsunomiya, S.
    Sasage, T.
    Kuwabara, R.
    Kuribayashi, T.
    Takatou, H.
    Aoyama, H.
    INTERNATIONAL JOURNAL OF RADIATION ONCOLOGY BIOLOGY PHYSICS, 2018, 102 (03): : E476 - E476
  • [42] Investigation of lag and ghosting in amorphous selenium flat-panel x-ray detectors
    Zhao, W
    DeCrescenzo, G
    Rowlands, JA
    MEDICAL IMAGING 2002: PHYSICS OF MEDICAL IMAGING, 2002, 4682 : 9 - 20
  • [43] Quantitative modeling of perovskite-based direct X-ray flat panel detectors
    Zihao Song
    Gaozhu Wang
    Jincong Pang
    Zhiping Zheng
    Ling Xu
    Ying Zhou
    Guangda Niu
    Jiang Tang
    Frontiers of Optoelectronics, 17 (1)
  • [44] Effect of combinational doping on x-ray sensitivity of a-Se films
    Natl Physical Lab, New Delhi, India
    J Phys D, 9 (1049-1051):
  • [45] Quantitative modeling of perovskite-based direct X-ray flat panel detectors
    Zihao Song
    Gaozhu Wang
    Jincong Pang
    Zhiping Zheng
    Ling Xu
    Ying Zhou
    Guangda Niu
    Jiang Tang
    Frontiers of Optoelectronics, 2024, 17 (04) : 7 - 12
  • [46] Double-Sided Bonding Process Enables X-ray Flat Panel Detectors
    Zhang, Hui
    Tie, Shujie
    Ye, Jiajiu
    Wang, Zihan
    Wan, Changmao
    Xu, Shendong
    Tao, Yuli
    Liang, Zheng
    Xu, Huifen
    Li, Jinfeng
    Zheng, Xiaojia
    Pan, Xu
    ACS APPLIED MATERIALS & INTERFACES, 2024, 16 (29) : 38252 - 38259
  • [47] Detective quantum efficiency of direct, flat panel x-ray imaging detectors for fluoroscopy
    Hunt, DC
    Zhao, W
    Rowlands, JA
    PHYSICS OF MEDICAL IMAGING, 1998, 3336 : 408 - 417
  • [48] Digital X-Ray Imaging Using Avalanche a-Se Photoconductor
    Sultana, Afrin
    Wronski, Matthew M.
    Karim, Karim S.
    Rowlands, J. A.
    IEEE SENSORS JOURNAL, 2010, 10 (02) : 347 - 352
  • [49] Measurement of the properties of a flat-panel gas X-ray detector
    Yun, Min-seok
    Cho, Sung-ho
    Oh, Kyung-min
    Kim, Min-woo
    Jung, Suk-hee
    Jang, Gi-won
    Heo, Seung-uk
    Kwon, Chul
    Nam, Sang-Hee
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2009, 607 (01): : 162 - 165
  • [50] Correction and enhancement of image from flat panel detector X-Ray system
    Fu, LQ
    Han, Y
    Wang, LM
    ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings, 2005, : 6484 - 6487
12345