Implementing Time Resolved Laser Assisted Device Alteration using Pulse on demand nanosecond Laser Diode

被引：0
|
作者：
Ravikumar, V. K. [1 ,2 ]
Ranganathan, G. [1 ]
Phoa, S. L. [1 ]
Chin, J. M. [1 ]
Pey, K. L. [2 ]
Yang, J. K. W. [2 ]
Kok, W. L. [3 ]
Koh, L. S. [4 ]
机构：
[1] Adv Micro Devices Inc, Singapore, Singapore
[2] Singapore Univ Technol & Design, Singapore, Singapore
[3] Einst Technol Pte Ltd, Singapore, Singapore
[4] Semicaps Pte Ltd, Singapore, Singapore
来源：
ISTFA 2016: CONFERENCE PROCEEDINGS FROM THE 42ND INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS | 2016年
关键词：
D O I：
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Time-resolved laser assisted device alteration (TR-LADA) has interesting applications to reduce the spatial spread of LADA site, as well as benefit device design debug. This paper describes an implementation using a 1063nm wavelength nanosecond pulse-on-demand laser diode to obtain a timing resolution of 1-2 tester cycles and spatial resolution enhancements to LADA sites. We also present potential capabilities of TR-LADA in the debug of analog circuitry.
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页码：527 / 532
页数：6
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