Field emission and electron microscopy

被引：0
|
作者：
Edgcombe, CJ
Valdrè, U
机构：
[1] Ist Nazl Fis Mat, I-40126 Bologna, Italy
[2] Univ Bologna, Dept Phys, I-40126 Bologna, Italy
[3] Univ Cambridge, Cavendish Lab, Dept Phys, Cambridge CB3 0HE, England
来源：
MICROSCOPY AND MICROANALYSIS | 2000年 / 6卷 / 04期
关键词：
work function; field emission; nano-tips; electron guns; finite element analysis; specimen holders; carbon contamination; transmission electron microscopy; scanning electron microscopy; scanning transmission electron microscopy;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An overview and new results are presented of the investigations carried out in the last 5 years on nano-sized tips by means of electron microscopy, an electron optical bench, and computation. Tungsten and. in particular, carbon nano-tips prepared by carbon contamination in a scanning electron microscope, were studied for applications as field-emission electron sources. Several features of their use are described and the results concerning the determination of some of their basic properties are reported.
引用
收藏
页码：380 / 387
页数：8
相关论文
共 50 条
  • [31] Characterisation of rare earth minerals with field emission scanning electron microscopy
    Demers, H.
    Gauvin, R.
    Brodusch, N.
    Waters, K.
    CANADIAN METALLURGICAL QUARTERLY, 2013, 52 (03) : 329 - 334
  • [32] Stabilized emission from micro-field emitter for electron microscopy
    Chen, L.
    El-Gomati, M. M.
    MICROELECTRONICS RELIABILITY, 2006, 46 (07) : 1209 - 1213
  • [33] Indirect Immunodetection of Fungal Fragments by Field Emission Scanning Electron Microscopy
    Afanou, Komlavi Anani
    Straumfors, Anne
    Skogstad, Asbjorn
    Nayak, Ajay P.
    Skaar, Ida
    Hjeljord, Linda
    Tronsmo, Arne
    Eduard, Wijnand
    Green, Brett James
    APPLIED AND ENVIRONMENTAL MICROBIOLOGY, 2015, 81 (17) : 5794 - 5803
  • [34] ANALYTICAL ELECTRON-MICROSCOPY USING A FIELD-EMISSION GUN
    BENTLEY, J
    JOURNAL OF METALS, 1979, 31 (12): : 135 - 136
  • [35] Fundamental Aspects of Near-Field Emission Scanning Electron Microscopy
    Zanin, D. A.
    Cabrera, H.
    De Pietro, L. G.
    Pikulski, M.
    Goldmann, M.
    Ramsperger, U.
    Pescia, D.
    Xanthakis, John P.
    ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 170, 2012, 170 : 227 - 258
  • [36] Field-Electron Emission Microscopy of Carbon-Saturated Rhenium
    Bernatskii, D. P.
    Pavlov, V. G.
    TECHNICAL PHYSICS LETTERS, 2017, 43 (06) : 590 - 592
  • [37] OBSERVATIONS OF NEEDLE CRYSTALS OF TUNGSTEN OXIDE BY FIELD EMISSION AND ELECTRON MICROSCOPY
    OKUYAMA, F
    JOURNAL OF APPLIED PHYSICS, 1971, 42 (01) : 256 - &
  • [38] Field-electron emission microscopy of carbon-saturated rhenium
    D. P. Bernatskii
    V. G. Pavlov
    Technical Physics Letters, 2017, 43 : 590 - 592
  • [39] A simple drying method for field emission scanning electron microscopy for chromosomes
    Bock, C
    Duschanek, I
    Martin, R
    BIOTECHNIC & HISTOCHEMISTRY, 1999, 74 (05) : 244 - 247
  • [40] ELECTRONIC ENVIRONMENT FOR A FIELD-EMISSION GUN IN ELECTRON-MICROSCOPY
    PINNA, H
    LIANG, K
    DENIZART, M
    JOUFFREY, B
    REVUE DE PHYSIQUE APPLIQUEE, 1983, 18 (10): : 659 - 665
12345