Fundamental Aspects of Near-Field Emission Scanning Electron Microscopy

被引：21
|
作者：
Zanin, D. A. [1 ]
Cabrera, H. [1 ]
De Pietro, L. G. [1 ]
Pikulski, M. [1 ]
Goldmann, M. [1 ]
Ramsperger, U. [1 ]
Pescia, D. [1 ]
Xanthakis, John P. [2 ]
机构：
[1] ETH, Festkorperphys Lab, CH-8093 Zurich, Switzerland
[2] Natl Tech Univ Athens, Dept Elect & Comp Engn, Athens 15700, Greece
来源：
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 170 | 2012年 / 170卷
关键词：
D O I：
10.1016/B978-0-12-394396-5.00005-1
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：227 / 258
页数：32
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