Fundamental Aspects of Near-Field Emission Scanning Electron Microscopy

被引：21
|
作者：
Zanin, D. A. [1 ]
Cabrera, H. [1 ]
De Pietro, L. G. [1 ]
Pikulski, M. [1 ]
Goldmann, M. [1 ]
Ramsperger, U. [1 ]
Pescia, D. [1 ]
Xanthakis, John P. [2 ]
机构：
[1] ETH, Festkorperphys Lab, CH-8093 Zurich, Switzerland
[2] Natl Tech Univ Athens, Dept Elect & Comp Engn, Athens 15700, Greece
来源：
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 170 | 2012年 / 170卷
关键词：
D O I：
10.1016/B978-0-12-394396-5.00005-1
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：227 / 258
页数：32
相关论文
共 50 条
  • [41] Multitip Near-Field Scanning Thermal Microscopy
    Ben-Abdallah, Philippe
    PHYSICAL REVIEW LETTERS, 2019, 123 (26)
  • [42] Near-field scanning optical microscopy of nanostructures
    DeAro, JA
    Weston, KD
    Buratto, SK
    PHASE TRANSITIONS, 1999, 68 (01) : 27 - 57
  • [43] Contact scanning near-field optical microscopy
    D. A. Lapshin
    S. K. Sekatskii
    V. S. Letokhov
    V. N. Reshetov
    Journal of Experimental and Theoretical Physics Letters, 1998, 67 : 263 - 268
  • [44] Theory of scanning near-field magnetooptical microscopy
    V. A. Kosobukin
    Technical Physics, 1998, 43 (7) : 824 - 829
  • [45] NEAR-FIELD OPTICAL-SCANNING MICROSCOPY
    DURIG, U
    POHL, DW
    ROHNER, F
    JOURNAL OF APPLIED PHYSICS, 1986, 59 (10) : 3318 - 3327
  • [46] Scanning near-field optical microscopy (SNOM)
    Cricenti, A.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 8, 2008, : 2615 - 2620
  • [47] Near-field scanning optical microscopy nanoprobes
    Fleischer, Monika
    NANOTECHNOLOGY REVIEWS, 2012, 1 (04) : 313 - 338
  • [48] Theory of scanning near-field magnetooptical microscopy
    Kosobukin, VA
    TECHNICAL PHYSICS, 1998, 43 (07) : 824 - 829
  • [49] Resolution in scanning near-field cathodoluminescence microscopy
    Pastré, D
    Bubendorff, JL
    Troyon, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (03): : 1138 - 1143
  • [50] Evidence of nonplanar field emission via secondary electron detection in near field emission scanning electron microscopy
    Kirk, T. L.
    Scholder, O.
    De Pietro, L. G.
    Ramsperger, U.
    Pescia, D.
    APPLIED PHYSICS LETTERS, 2009, 94 (15)
12345