The amorphous Bi5Nb3O15 film grown at room temperature under all oxygen-plasma sputtering ambient (BNRT-O-2 film) has a hydrophobic surface with a surface energy of 35.6 mJ m(-2), which is close to that of the orthorhombic pentacene (38 mJ m(-2)), resulting in the formation of a good pentacene layer without the introduction of all additional polymer layer. This film was very flexible, maintaining a high capacitance of 145 nF cm(-2) during and after 10(5) bending cycles with a small curvature radius of 7.5 mill. This film was optically transparent. Furthermore, the flexible, pentacene-based, organic thin-film transistors (OTFTs) fabricated oil the poly(ether sulfone) substrate at room temperature using a BNRT-O-2 film as a gate insulator exhibited a promising device performance with a high field effect mobility of 0.5 cm(2) V-1 s(-1), an on/off current modulation of 10(5), and a small subthreshold slope of 0.2 V decade(-1) under a low operating voltage of -5 V. This device also maintained a high carrier mobility of 0.45 cm(2) V-1 s(-1) during the bending with a small curvature radius of 9 mm. Therefore, the BNRT-O-2 film is considered a promising material for the gate insulator of the flexible, pentacene-based OTFT.
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Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South KoreaKorea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
Cho, Kyung-Hoon
Choi, Chang-Hak
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Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South KoreaKorea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
Choi, Chang-Hak
Hong, Kyoung Pyo
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Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South KoreaKorea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
Hong, Kyoung Pyo
Choi, Joo-Young
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Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South KoreaKorea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
Choi, Joo-Young
Jeong, Young Hun
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Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South KoreaKorea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
Jeong, Young Hun
Nahm, Sahn
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机构:Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
Nahm, Sahn
Kang, Chong-Yun
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Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South KoreaKorea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
Kang, Chong-Yun
Yoon, Seok-Jin
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Korea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 136791, South KoreaKorea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
Yoon, Seok-Jin
Lee, Hwack-Joo
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Korea Res Inst Stand & Sci, New Mat Evaluat Ctr, Taejon 305600, South KoreaKorea Univ, Dept Mat Sci & Engn, Seoul 136701, South Korea
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Penn State Univ, Ctr Thin Film Devices, University Pk, PA 16802 USA
Penn State Univ, Mat Res Inst, Dept Elect Engn, University Pk, PA 16802 USAPenn State Univ, Ctr Thin Film Devices, University Pk, PA 16802 USA
Li, Yuanyuan V.
Ramirez, Jose Israel
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Penn State Univ, Ctr Thin Film Devices, University Pk, PA 16802 USA
Penn State Univ, Mat Res Inst, Dept Elect Engn, University Pk, PA 16802 USAPenn State Univ, Ctr Thin Film Devices, University Pk, PA 16802 USA
Ramirez, Jose Israel
Sun, Kaige G.
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Penn State Univ, Ctr Thin Film Devices, University Pk, PA 16802 USA
Penn State Univ, Mat Res Inst, Dept Elect Engn, University Pk, PA 16802 USAPenn State Univ, Ctr Thin Film Devices, University Pk, PA 16802 USA
Sun, Kaige G.
Jackson, Thomas N.
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Penn State Univ, Ctr Thin Film Devices, University Pk, PA 16802 USA
Penn State Univ, Mat Res Inst, Dept Elect Engn, University Pk, PA 16802 USAPenn State Univ, Ctr Thin Film Devices, University Pk, PA 16802 USA