A Simple Self-Calibrating Method To Measure the Height of Fluorescent Molecules and Beads at Nanoscale Resolution

被引：3
|
作者：
Kerssemakers, Jacob W. J. [1 ]
Blosser, Timothy R. [1 ]
Dekker, Cees [1 ]
机构：
[1] Delft Univ Technol, Dept Bionanosci, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands
来源：
NANO LETTERS | 2014年 / 14卷 / 08期
基金：
欧洲研究理事会;
关键词：
Height determination; fluorescence; total internal reflection fluorescence; nanoscale resolution; INTERFERENCE; LOCALIZATION; MICROSCOPY; TRACKING;
D O I：
10.1021/nl501434v
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
We describe a simple self-calibrating technique, incident-beam interference sweeping, for measuring the height of fluorescent labels. Using a tilted back-reflecting mirror and a scanning laser beam, a modulated fluorescence emission allows height determination of a label from a surface with a resolution of similar to 3 nm. In addition, we show that the absolute distance of a label from the top-mounted mirror can be determined with a resolution of a few tens of nanometers over a micrometer range.
引用
收藏
页码：4469 / 4475
页数：7
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