Alternative method of wavelength drift free dual-wavelength heterodyne interferometry for the absolute distance measurement

被引：0
|
作者：
Chen, Kun-Huang [1 ]
Chen, Jing-Heng [2 ]
Wu, Chi-Chang [1 ]
Chang, Wei-Yao [1 ]
机构：
[1] Feng Chia Univ, Dept Elect Engn, Taichung 40724, Taiwan
[2] Feng Chia Univ, Dept Photon, Taichung 40724, Taiwan
来源：
OPTICAL REVIEW | 2009年 / 16卷 / 04期
关键词：
heterodyne interferometry; absolute distance; dual-wavelength; phase difference; LASER;
D O I：
10.1007/s10043-009-0096-2
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Based on the technique of dual-wavelength and principle of heterodyne interferometry, a modified method for measuring the absolute distance is proposed. Because two test lights suffer from the same influence of wavelength drift in the measurement setup, the minus effect coming from the wavelength drift can be offset. Therefore, the measurement accuracy can be significantly increased. The feasibility of this method was demonstrated with a measurement resolution of about 1.50 mu m. This method provides the advantages of a simple optical setup, easy operation and rapid measurement.
引用
收藏
页码：492 / 494
页数：3
相关论文
共 50 条
  • [31] Absolute distance measurement using synthetic wavelength interferometry of optical frequency combs
    Wu, Guanhao
    Liao, Lei
    [J]. 2017 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2017,
  • [32] Simultaneous dual-wavelength phase-shifting interferometry for surface topography measurement
    Liu, Qian
    Li, Lulu
    Zhang, Hui
    Huang, Wen
    Yue, Xiaobin
    [J]. OPTICS AND LASERS IN ENGINEERING, 2020, 124
  • [33] QUANTIFICATION OF THE HEMATOPORPHYRIN DERIVATIVE BY FLUORESCENCE MEASUREMENT USING DUAL-WAVELENGTH EXCITATION AND DUAL-WAVELENGTH DETECTION
    SINAASAPPEL, M
    STERENBORG, HJCM
    [J]. APPLIED OPTICS, 1993, 32 (04): : 541 - 548
  • [34] Measurement of large internal diameters with a compact apparatus based on dual-wavelength heterodyne interferometer
    Li, B
    Liang, JW
    [J]. PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1997, 21 (01): : 36 - 42
  • [35] Shape verification using dual-wavelength holographic interferometry
    Bergstrom, Per
    Rosendahl, Sara
    Gren, Per
    Sjodahl, Mikael
    [J]. OPTICAL ENGINEERING, 2011, 50 (10)
  • [36] DETERMINATION OF REFRACTIVE PROPERTIES OF FLUIDS FOR DUAL-WAVELENGTH INTERFEROMETRY
    VIKRAM, CS
    WITHEROW, WK
    TROLINGER, JD
    [J]. APPLIED OPTICS, 1992, 31 (34): : 7249 - 7252
  • [37] Absolute distance interferometry using variable synthetic wavelength
    Salewski, KD
    Bechstein, KH
    Wolfram, A
    Fuchs, W
    [J]. TECHNISCHES MESSEN, 1996, 63 (01): : 5 - 13
  • [38] Dual-wavelength interferogram decoupling method for three-frame generalized dual-wavelength phase-shifting interferometry based on deep learning
    Xu, Xiaoqing
    Xie, Ming
    Ji, Ying
    Wang, Wawei
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2021, 38 (03) : 321 - 327
  • [39] Dual-wavelength laser source for onboard atom interferometry
    Menoret, V.
    Geiger, R.
    Stern, G.
    Zahzam, N.
    Battelier, B.
    Bresson, A.
    Landragin, A.
    Bouyer, P.
    [J]. OPTICS LETTERS, 2011, 36 (21) : 4128 - 4130
  • [40] Absolute angle measurement using dual-wavelength laser speckle for robotic manufacturing
    Gibson, Sam J.
    Charrett, Tom O. H.
    Tatam, Ralph P.
    [J]. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION XI, 2019, 11056
12345