Production of capacitive films from Mn thin films: Effects of current density and film thickness

被引:23
|
作者
Djurfors, B.
Broughton, J. N.
Brett, M. J.
Ivey, D. G. [1 ]
机构
[1] Univ Alberta, Dept Chem & Mat Engn, Edmonton, AB T6G 2G6, Canada
[2] Univ Alberta, Dept Elect & Comp Engn, Edmonton, AB T6G 2V4, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
scanning electron microscopy; manganese oxide; electrochemical supercapacitor; physical vapor deposition; x-ray photoelectron spectroscopy;
D O I
10.1016/j.jpowsour.2005.06.011
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electrochemical oxidation of Mn thin films produces a highly capacitive, porous MnO2 surface layer. The effects of current density and deposited Mn layer thickness on the morphology of the porous surface layer are quite pronounced. A higher current density results in a much thinner, finer porous layer while thicker deposited Mn films give much thicker porous films. Increasing the current density results in a film with greater hydration and an increase in capacitance. For the films of varying deposited layer thickness, oxidation occurs at a single current density and, as a result, the relative hydration of the film does not change noticeably. Increasing the deposited layer thickness results in a porous surface layer that increases in thickness, but with a constant amount of hydration. This combination of trends results in a significant increase in the areal capacitance of the film but little change in the specific capacitance. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:741 / 747
页数:7
相关论文
共 50 条
  • [21] ON CURRENT DENSITY DEPENDENCE OF ELECTROMIGRATION IN THIN FILMS
    HOFMAN, GL
    BREITLIN.HM
    PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (05): : 833 - &
  • [22] Thickness dependence of the current density distribution in superconducting films
    Laviano, F
    Botta, D
    Gerbaldo, R
    Ghigo, G
    Gozzelino, L
    Gianni, L
    Zannella, S
    Mezzetti, E
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2004, 404 (1-4): : 220 - 225
  • [23] Thickness effects on the magnetism of Ho thin films
    Herring, ADF
    Nuttall, WJ
    Thomas, MF
    Goff, JP
    Stunault, A
    Ward, RCC
    Wells, MR
    Stirling, WG
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2005, 17 (17) : 2543 - 2552
  • [24] QUANTITATIVE MEASUREMENT OF FILM THICKNESS, DENSITY AND STOICHIOMETRY OF MULTILAYER THIN FILMS ON THICK SUBSTRATES.
    Hichwa, B.P.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1986, B24-25 (pt 1 Apr III) : 584 - 586
  • [25] QUANTITATIVE MEASUREMENT OF FILM THICKNESS, DENSITY AND STOICHIOMETRY OF MULTILAYER THIN-FILMS ON THICK SUBSTRATES
    HICHWA, BP
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 24-5 : 584 - 586
  • [26] Influence of film thickness and composition on the martensitic transformation in epitaxial Ni-Mn-Sn thin films
    Teichert, N.
    Auge, A.
    Yuzuak, E.
    Dincer, I.
    Elerman, Y.
    Krumme, B.
    Wende, H.
    Yildirim, O.
    Potzger, K.
    Huetten, A.
    ACTA MATERIALIA, 2015, 86 : 279 - 285
  • [27] The effects of film thickness variations on the residual stress distributions in coated Cr thin films
    Chien, Chi-Hui
    Su, Ting-Hsuan
    Wang, Chung-Ting
    Gan, Jia-Lun
    Wang, Jhao-Shun
    STRAIN, 2017, 53 (02)
  • [28] Effects of film thickness on the structural characteristics and optical properties of Ag nanostructure thin films
    Wang, Li-Ping
    Han, Pei-De
    Zhang, Zhu-Xia
    Xu, Bing-She
    Rengong Jingti Xuebao/Journal of Synthetic Crystals, 2014, 43 (01): : 99 - 104
  • [29] Thickness dependence of nanocrystalline tin oxide thin films in capacitive biosensor characterization
    Choudhury, Sipra
    Nautiyal, Rashmi
    Thakkar, Drashti K.
    Betty, C.A.
    Journal of Electroanalytical Chemistry, 2020, 877
  • [30] Thickness dependence of nanocrystalline tin oxide thin films in capacitive biosensor characterization
    Choudhury, Sipra
    Nautiyal, Rashmi
    Thakkar, Drashti K.
    Betty, C. A.
    JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 2020, 877