High-speed InGaP/GaAs HBT's using a simple collector undercut technique to reduce base-collector capacitance

被引:29
|
作者
Chen, WL
Chau, HF
Tutt, M
Ho, MC
Kim, TS
Henderson, T
机构
[1] Corporate R. and D., System Components Laboratory, Texas Instruments Inc., Dallas
关键词
D O I
10.1109/55.596935
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-speed InGaP/GaAs HBT's were fabricated using a simple collector undercut (CU) technique to physically remove the collector material underneath the extrinsic base region by selective etching for seducing base-collector capacitance (C-BC) The best HBT's achieved a f(T) of 80 GHz and a f(max) (MSG/MAG) of 171 GHz. To our knowledge, this is the highest f(max) (MSG/MAG) ever reported for the InGaP/GaAs HBT's. Compared to the HBT's without CU's, the CU HBT's shored a factor of 1.38 times improvement in the highest achievable f(max) (MSG/MAG) due to the significant reduction of the C-BC.
引用
收藏
页码:355 / 357
页数:3
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