TEM observation of two-dimensional defects in CdTe crystals

A specimen from a melt-grown CdTe crystal was prepared by the "suspension" method. Selected area electron diffraction (SAED) image revealed the presence of stacking faults and a twice twinned crystal lattice in the examined specimen. Many dislocations, stacking faults as well as first-order and second-order twin boundaries, accompanied by many dislocations lying in (or close to) the grain boundary plane were observed in the diffraction contrast mode images. The main types of the existing defects were modeled, and the corresponding SAED pattern images were successfully simulated.