共 50 条
- [41] Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-VDD test [J]. 11TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, 2005, : 281 - 286
- [42] A Method for Optimum Test Point Selection and Fault Diagnosis Strategy for BIT of Avionic System [J]. IEEE CIRCUITS AND SYSTEMS INTERNATIONAL CONFERENCE ON TESTING AND DIAGNOSIS, 2009, : 70 - 74
- [44] Test Node Selection for Fault Diagnosis in Analog Circuits using Faster RCNN Model [J]. Circuits, Systems, and Signal Processing, 2023, 42 : 3229 - 3254
- [46] Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test [J]. 2010 19TH IEEE ASIAN TEST SYMPOSIUM (ATS 2010), 2010, : 429 - 432
- [47] Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparison [J]. IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, 2003, : 60 - 64
- [48] Combined intelligent fault diagnosis research on missiles based on a general automatic test system [J]. ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings, 2005, : 7417 - 7420
- [49] Randomized test case generation for hybrid systems: metric selection [J]. PROCEEDINGS OF THE THIRTY-SIXTH SOUTHEASTERN SYMPOSIUM ON SYSTEM THEORY, 2004, : 236 - 240
- [50] Automated product line test case selection: industrial case study and controlled experiment [J]. Software & Systems Modeling, 2017, 16 : 417 - 441