Opto-mechanical probe for combining atomic force microscopy and optical near-field surface analysis

被引：8

作者：

van Hoorn, C. H. ^{[1
,2
]}

Chavan, D. C. ^{[1
,2
]}

Tiribilli, B. ^{[3
]}

Margheri, G. ^{[3
]}

Mank, A. J. G. ^{[4
]}

Ariese, F. ^{[1
,2
]}

Iannuzzi, D. ^{[1
,2
]}

机构：

[1] Vrije Univ Amsterdam, Dept Phys & Astron, Amsterdam, Netherlands

[2] Vrije Univ Amsterdam, Laserlab Amsterdam, Amsterdam, Netherlands

[3] CNR, Inst Complex Syst, Sesto Fiorentino, Italy

[4] Philips Innovat Serv, Eindhoven, Netherlands

来源：

OPTICS LETTERS | 2014年 / 39卷 / 16期

关键词：

SCANNING TUNNELING MICROSCOPE; LIQUID; SENSOR;

D O I：

10.1364/OL.39.004800

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have developed a new easy-to-use probe that can be used to combine atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM). We show that, using this device, the evanescent field, obtained by total internal reflection conditions in a prism, can be visualized by approaching the surface with the scanning tip. Furthermore, we were able to obtain simultaneous AFM and SNOM images of a standard test grating in air and in liquid. The lateral resolution in AFM and SNOM mode was estimated to be 45 and 160 nm, respectively. This new probe overcomes a number of limitations that commercial probes have, while yielding the same resolution. (C) 2014 Optical Society of America

引用

页码：4800 / 4803

页数：4

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