Interferometric probe for near-field optical microscopy systems

被引：0
|
作者：
Yu. N. Kul’chin
O. B. Vitrik
A. V. Bezverbnyi
A. V. Dyshlyuk
A. A. Kuchmizhak
机构：
[1] Russian Academy of Sciences,Institute of Automation and Control Processes, Far East Branch
来源：
Technical Physics Letters | 2010年 / 36卷
关键词：
Technical Physic Letter; Scanning Near Field Optical Microscopy; Pinhole Diameter; Resonance Wavelength Shift; Optical Microscopy System;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
We have studied the possibility of creating a new type of the interferometric near-field pinhole probe for near-field optical microscopy systems based on a Fabry-Perot fiber microresonator with a nanodimensional pinhole in one of its output mirrors. The dependence of the resonance wavelength shift in the Fabry-Perot interferometer on the distance from the output diaphragm to the object has been determined using the finite-difference method in the time domain. It is shown that the proposed technique ensures a spatial resolution of no worse than λ/15.
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页码：599 / 601
页数：2
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