Structural study of the semimagnetic semiconductor Zn0.5Mn0.5In2Te4

被引：2
|
作者：
Delgado, G. E. [1 ]
Sagredo, V. [2 ]
机构：
[1] Univ Los Andes, Fac Ciencias, Dept Quim, Lab Cristalog, Merida 5101, Venezuela
[2] Univ Los Andes, Fac Ciencias, Dept Quim, Lab Magnetismo Solidos, Merida 5101, Venezuela
来源：
CRYSTAL RESEARCH AND TECHNOLOGY | 2009年 / 44卷 / 02期
关键词：
semiconductor; X-ray powder diffraction; crystal structure; Rietveld refinement; ZN1-XMNXIN2TE4; RELIABILITY; CRITERION; BEHAVIOR;
D O I：
10.1002/crat.200800089
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
The semimagnetic semiconductor alloy Zn0.5Mn0.5In2Te4 was refined from an X-ray powder diffraction pattern using the Rietveld method. This compound crystallizes in the space group I (4) over bar 2m (N degrees 121), Z = 2, with unit cell parameters a = 6.1738(1) angstrom, c = 12.3572(4) angstrom, V = 471.00(2) angstrom(3), c/a = 2.00. This material crystallizes in a stannite-type structure. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码：203 / 205
页数：3
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