Structural and Optical Properties of Thin Ternary Semiconductor Alloy Cd0.5Zn0.5Te

A higher quality and a nearly stoichiometric composition of Cd0.5Zn0.5Te have been successfuly grown on glass substrate by vacuum evaporation technique. The composition and structural studies are investigated by energy dispersive X-ray analysis, SEM, and X-Ray diffraction. Film optical constants are determined from transmittance measurments at normal light incidence in the spectral range (500-2500 nm). The presence of interference fringes and of a sharp absorption edge are indicatives of a very good optical quality. Analysis of the refractive index n(lambda), of the induced absorption alpha (h nu) and the determination of the energy bandgap Eg, are then given from the aquisition of the transmission data. Comparaison with previous works on films prepared by other techniques confirms a better quality of our films prepared at low cost.