Structural and Optical Properties of Ternary Semiconductor Alloy Cd0.5Zn0.5Te

A higher quality and a nearly stoichiometric composition of Cd0.5Zn0.5Te have been successfully grown on glass substrate by hot wall evaporation technique. The composition and structural studies are investigated by energy dispersive X-ray analysis, SEM, and X-ray diffraction. Film optical constants are determined from transmittance measurements at normal light incidence in the 500-2500 nm spectral range. The presence of interference fringes and sharp absorption edge are indicatives of a very good optical quality. Analysis of the refractive index n(lambda), of the induced absorption alpha(hv) and the determination of the energy band gap E-g, are then obtained from the acquisition of the transmission data. Comparison with previous works on films prepared by other techniques confirms a better quality of our films prepared at low cost.