Introduction to the Special Issue on the 2020 IEEE International Solid-State Circuits Conference (ISSCC)

被引：0

作者：

Blaauw, David ^{[1
]}

Lee, Hoi ^{[2
]}

Keane, John P. ^{[3
]}

Choi, Jaehyouk ^{[4
]}

Pamarti, Sudhakar ^{[5
]}

机构：

[1] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA

[2] Univ Texas Dallas, Dept Elect & Comp Engn, Richardson, TX 75080 USA

[3] Keysight Technol Inc, Santa Clara, CA 95051 USA

[4] Korea Adv Inst Sci & Technol, Sch Elect Engn, Daejeon 34141, South Korea

[5] Univ Calif Los Angeles, Dept Elect & Comp Engn, Los Angeles, CA 90095 USA

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2020年 / 55卷 / 12期

关键词：

D O I：

10.1109/JSSC.2020.3029347

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This Special Issue of the IEEE Journal of Solid-State Circuits is dedicated to a collection of the best papers selected from the 2020 IEEE International Solid-State Circuits Conference (ISSCC) that took place on February 16-20, 2020, in San Francisco, CA, USA. This issue covers papers from the Analog, Power Management, Data Converters, RF, and Wireless committees.

引用

页码：3127 / 3130

页数：4

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